Bugscope - Educational outreach project of the World Wide Laboratory. The primary goal of the Bugscope project is to demonstrate that relatively low cost, sustainable access to a scanning electron microscope can be made available to K-12 classrooms.
Ernst Ruska-Centre for Microscopy - A multidiscipline division in Germany providing scientific researchers with resources and services.
ESEMIR - Third-part laboratory for microstructural analyses by Environmental Electron Microscopy and FT-IR infra red microscopy.
Homebuilt STM Project - An amateur project to build a scanning tunneling microscope, including detailed descriptions of mechanics, electronics and software.
Imaging Advances in Scanning Electron Microscopy - Lucis image-processing technology enhances SEM images using Differential Hysteresis Processing. Lucis reveals vivid detail previously beyond visual perception.
MAC Calibration Standards for SEM TEM BSD BSED STEM - MAC manufacture standards for the following micro-analysis systems: AUGER, BSED, EDX, SEM, STEM, TEM, WDX, XRF, and micro-probe. They also manufacture calibration standards for BSED and scanning electron microscope (SEM).
M.E. Taylor Engineering - Provides electron microscopy supplies and equipment and custom machining and laboratory services.
Microanalyst - Information and forum about microanalysis with X-ray spectrometer (EDX) in Electron Microscope (EPMA)
Microvision Labs - Offers SEM and light microscopy services in the Boston, MA area.
SEM Images - Scanning electron microscope photography of David Scharf.
SEM Images - Scientific stock images taken with electron microscopes.
SEM-EDS Laboratory - Industrial scanning electron microscopy (SEM) and energy dispersive spectrometer (EDS) laboratory in the company Metal Ravne d.o.o.
Simple STM Design Page - This site features a Simple Scanning Tunneling Microscope (STM) design costing less than $100 to build, with complete schematics, photos and materials lists.
Smartech - SMARTech has the ability to generate conventional digital SEM images from 15 to 150,000 times. We can acquire Scanning Electron Microscopy images with either our conventional Everhart and Thornley detector or a solid state backscattered electron detector.
